CHARGING EFFECTS IN SMALL-AREA MODULATION-DOPED DOUBLE-BARRIER HETEROSTRUCTURES

Citation
S. Tarucha et al., CHARGING EFFECTS IN SMALL-AREA MODULATION-DOPED DOUBLE-BARRIER HETEROSTRUCTURES, Surface science, 305(1-3), 1994, pp. 547-552
Citations number
12
Categorie Soggetti
Chemistry Physical
Journal title
ISSN journal
00396028
Volume
305
Issue
1-3
Year of publication
1994
Pages
547 - 552
Database
ISI
SICI code
0039-6028(1994)305:1-3<547:CEISMD>2.0.ZU;2-K
Abstract
Charging effects on resonant tunneling are studied in modulation-doped double-barrier heterostructures. We observe a blockade of the tunneli ng current around zero-bias in small-area devices, while in large-area devices we observe a tunneling current with a zero-threshold bias due to the modulation doping. The blockade voltage width varies in propor tion to the inverse square of the conducting diameter, and agrees well with the calculated charging energy for a single electron. At the hig h voltage end of this blockade region we observe step-like current-vol tage features and fine structure in the form of small peaks and should ers. This fine structure is related to the interplay between charging and size quantization effects.