Gold thin films have been observed using scanning shearing-stress micr
oscopy (SSSM), which is a new scanning probe microscopy based on a sca
nning tunneling microscope (STM) and a frequency shift of an AT-cut qu
artz resonator. The quartz resonator coupled to an STM sample is oscil
lated at its resonance frequency. The resonance frequency shift corres
ponds to the shearing-stress changes in the sample under tip scanning.
Images of STM and SSSM topographies of gold thin films can be observe
d simultaneously. The shearing-stress distribution is caused by scanni
ng-direction slope changes in STM profiles; therefore these stresses a
re caused by frictional force between the STM tip and sample.