COPPER PHTHALOCYANINE-TITANIUM OXIDE MULTILAYERS

Copper phthalocyanine-titanium oxide (CuPc-TiO(x)) heteromultilayers h ave been fabricated by evaporation and reactive evaporation techniques , and their structural and optoelectronic properties investigated. X-r ay diffraction and secondary ion mass spectroscopy confirm the formati on of a clear alternating layered structure on a nanometer scale. An i nterface roughness of 7 angstrom has been achieved for a multilayer wi th an artificial period of 40 angstrom. Atomic force microscopy at scr atched edges of the multilayers reveal double-layered structures of Ti O(x) on CuPc, indicating the existence of two kinds of interface. Tran sverse photoconduction measurements on samples deposited on SnO2-coate d glass, using a back electrode of Al, show the occurrence of electron transfer from CuPc to TiO(x) at the interfaces.