LOCAL STOICHIOMETRY MEASUREMENT OF Y-BA-CU-O THIN-LAYERS GROWN BY METAL-ORGANIC CHEMICAL-VAPOR-DEPOSITION

Citation
E. Waffenschmidt et al., LOCAL STOICHIOMETRY MEASUREMENT OF Y-BA-CU-O THIN-LAYERS GROWN BY METAL-ORGANIC CHEMICAL-VAPOR-DEPOSITION, Journal of applied physics, 75(8), 1994, pp. 4092-4096
Citations number
16
Categorie Soggetti
Physics, Applied
Journal title
ISSN journal
00218979
Volume
75
Issue
8
Year of publication
1994
Pages
4092 - 4096
Database
ISI
SICI code
0021-8979(1994)75:8<4092:LSMOYT>2.0.ZU;2-I
Abstract
Y-Ba-Cu-O thin films with different stoichiometry were grown by metal organic chemical vapor deposition on MgO and SrTiO3. The samples showe d superconducting behavior in a wide range of average stoichiometry. H owever, energy dispersive x-ray spectroscopy (EDX) measurements show t hat best results can be obtained only in a small stoichiometry range. Critical temperatures of T(c) > 89 K and critical current densities of j(c) (77 K) > 2 x 10(6) A/cm2 could be obtained with optimized stoich iometry. Spatially resolved EDX measurements show that copper tends to form precipitates on the layers if its average content exceeds 50 mol %, while yttrium is incorporated into the matrix if offered in excess .