Single-shot laser damage of Ni and Cr films on fused silica substrates
has been studied as a function of film thickness, utilizing 248 nm/14
ns pulses and detection by probe beam deflection. Threshold fluences
for visible damage and vaporization are compared to predictions of the
heat diffusion model. The model fits thresholds for visible damage we
ll and identifies their origin, which is melting for Ni films and brit
tle-to-ductile phase transition for Cr films. When predicting threshol
ds for vaporization, the diffusion model is of limited success in case
of Ni films but fails completely for Cr films, indicating that transi
ent thermal properties of the material should be taken into account. M
icroscopic inspection shows that Cr films rupture at low fluences befo
re entering the common sequence of melting and vaporizing with increas
ing fluence.