PHOTOELECTRON EMISSION IN FEMTOSECOND LASER-ASSISTED SCANNING-TUNNELING-MICROSCOPY

Citation
W. Pfeiffer et al., PHOTOELECTRON EMISSION IN FEMTOSECOND LASER-ASSISTED SCANNING-TUNNELING-MICROSCOPY, Applied physics. B, Lasers and optics, 64(2), 1997, pp. 265-268
Citations number
14
Categorie Soggetti
Physics, Applied",Optics
ISSN journal
09462171
Volume
64
Issue
2
Year of publication
1997
Pages
265 - 268
Database
ISI
SICI code
0946-2171(1997)64:2<265:PEIFLS>2.0.ZU;2-F
Abstract
Direct illumination of the tunneling gap in an ultrahigh vacuum scanni ng tunneling microscope with ultrashort pump-probe laser pulses may of fer ultimate spatial and temporal resolution in surface experiments. T he electronic bandwidth of the tunneling gap (< 1 THz) does not limit the time resolution. Our experiments show that multiphoton photoelectr on emission from the sample limits the application of this detection s cheme at high laser fluence. However, a substrate specific pump-probe effect in the photoelectron yield with femtosecond transients is obser ved on Tantalum and on GaAs(110) surfaces.