TESTING LOGIC-INTENSIVE MEMORY ICS ON MEMORY TESTERS

Authors
WU R GERNER J WHEELUS R LEW K
Citation
R. Wu et al., TESTING LOGIC-INTENSIVE MEMORY ICS ON MEMORY TESTERS, IEEE design & test of computers, 14(1), 1997, pp. 50-54
Citations number
3
Categorie Soggetti
Computer Sciences","Computer Science Hardware & Architecture
Journal title
IEEE design & test of computers → ACNP
ISSN journal
07407475
Volume
14
Issue
1
Year of publication
1997
Pages
50 - 54
Database
ISI
SICI code
0740-7475(1997)14:1<50:TLMIOM>2.0.ZU;2-1
Abstract
This tool converts logic test vectors into memory test patterns and ge nerates a corresponding memory test program for use on an economical m emory tester. The authors report a sample time savings of 99% over man ual conversion.