T. Fujisawa et al., ALGAAS INGAAS/GAAS SINGLE-ELECTRON TRANSISTORS FABRICATED BY GA FOCUSED ION-BEAM IMPLANTATION/, Applied physics letters, 64(17), 1994, pp. 2250-2252
Single electron transistors are formed in an AlGaAs/InGaAs/GaAs modula
tion-doped heterostructure by Ga focused ion beam implantation. The Al
GaAs/InGaAs/GaAs system has a high two-dimensional electron gas densit
y and facilitates a lateral constriction whose depletion length is muc
h smaller than that in a conventional AlGaAs/GaAs system. A dot struct
ure confined by a small depletion spreading of less than 0.15 mum is f
ormed by the ion implantation. This ion implantation is also employed
to form in-plane gates for controlling the tunneling junctions between
the dot and reservoirs, and the number of electrons in the dot. Coulo
mb oscillations and a Coulomb staircase have been clearly observed by
controlling three in-plane gates.