1ST-PRINCIPLES INVESTIGATION OF THE ELECTRONIC-STRUCTURE OF SI-BASED LAYERED STRUCTURES

Citation
F. Bernardini et al., 1ST-PRINCIPLES INVESTIGATION OF THE ELECTRONIC-STRUCTURE OF SI-BASED LAYERED STRUCTURES, Surface science, 309, 1994, pp. 984-988
Citations number
19
Categorie Soggetti
Chemistry Physical
Journal title
ISSN journal
00396028
Volume
309
Year of publication
1994
Part
B
Pages
984 - 988
Database
ISI
SICI code
0039-6028(1994)309:<984:1IOTEO>2.0.ZU;2-Y
Abstract
The electronic properties of ultra-thin Si layers have been investigat ed. Using the linear muffin tin orbital (LMTO) method, we have studied band gap and interface states for supercells formed by Si(111) layers of variable thickness (1-7 double layers) embedded in a CaF2 host cry stal, a system with interesting analogies to porous silicon. Our resul ts show that the band gap opening is dominated by the valence band whi ch follows the effective mass confinement picture, while the conductio n band is found to flatten out and shift very modestly. The latter beh aviour is due to hybridization effects between Si and Ca states which lead to bonding-antibonding interface states in the gap. For 1 and 2 d ouble layers the bonding Si-Ca states emerge from the Si valence band and lead to an almost direct gap at finite wavevectors. This behaviour could account for efficient visible luminescence in this system. The relevance of these results for Si-based low-dimensional structures is discussed.