SCANNING PROBE MICROSCOPY - TECHNOLOGY AND RECENT INNOVATIONS

Authors
STRAUSSER YE HEATON MG
Citation
Ye. Strausser et Mg. Heaton, SCANNING PROBE MICROSCOPY - TECHNOLOGY AND RECENT INNOVATIONS, American laboratory, 26(6), 1994, pp. 20
Citations number
2
Categorie Soggetti
Instument & Instrumentation","Chemistry Analytical
Journal title
American laboratory → ACNP
ISSN journal
00447749
Volume
26
Issue
6
Year of publication
1994
Database
ISI
SICI code
0044-7749(1994)26:6<20:SPM-TA>2.0.ZU;2-G
Abstract
Scanning probe microscopes are relatively recent additions to microsco pic measurement and have quickly become the most powerful tools for in vestigation of the microscopic environment.