A study has been made of the possibility of using sulfide passivation
of a surface in order to achieve repeated growth by liquid-phase epita
xy on epitaxial layers of AlxGa1-xAs solid solutions which have been e
xposed to air. The results show that the surface passivation in sodium
sulfide solutions does indeed make possible a repeated growth on AlxG
a1-xAs, at aluminum concentrations up to x = 0.8. The quality of the l
ayer which is grown depends in a definite way on the passivation condi
tions: the higher the aluminum content in the substrate, the more conc
entrated the sodium sulfide solution required to achieve a high-qualit
y layer. Passivation in ammonium sulfide solutions does not support re
peated growth. The etching of GaAs and AlxGa1-xAs in sodium sulfide so
lutions has been studied in order to optimize the passivation conditio
ns. The etching process is nonuniform, slowing down as time elapses, u
ntil the process comes to a complete halt. A mechanism is proposed for
the observed effects. This mechanism is based on chemical reactions w
hich occur at the surface of a semiconductor in the sulfide solutions.
An examination of these reactions shows that the state of the surface
during the passivation is determined by two competing processes: the
etching of the semiconductor in the basic medium and the formation of
a passivating coating as a result of the chemisorption of S-2 anions o
n the surface.