The current-voltage characteristic of diffused-alloy silicon p-n junct
ions and their properties under avalanche-breakdown conditions have be
en studied in the temperature range 77-300 K at electron bombardment f
luxes in the range 1 X 10(11)-5 X 10(17) cm-2. The energy of the elect
rons was E = 4 MeV. The results are reported. A stepped, S-shaped curr
ent-voltage characteristic forms at T < 150 K. This characteristic is
associated with a charge exchange of divacancy and E-center levels dur
ing the breakdown of the bombarded p-n junctions. The total noise curr
ent at the bombarded p-n junction was found to increase at temperature
s corresponding to the onset of a relaxation delay of the breakdown.