Using a hot-wall CVD reactor, silicon precipitation rates in the SiHCl
3-Ar and SiHCl3-H-2-Ar systems were measured in order to elucidate the
reaction kinetics in these systems. Silicon precipitation in the form
er system takes place through the thermal decomposition reaction of Si
HCl3 and its rate is a function of reactant SiHCl3 mole fraction and r
eaction temperature. That in the latter system takes place through the
hydrogen reduction of SiHCl3 in addition to the thermal decomposition
reaction and its rate can be expressed as a function of SiHCl3 and H-
2 mole fractions and temperature. In both systems, the transition temp
erature from chemical reaction control region to mass transfer control
region is around 1173 K. From the observed reactant concentration dep
endence on these rate expression, a plausible reaction mechanism is pr
oposed where SiCl2 (g) and its adsorbed species are the reaction inter
mediate in the precipitation reaction scheme.