OPTICAL DETERMINATION OF GROWTH VARIANTS IN ORDERED GAINP

Measurements on the dependence of the ellipsometric parameters as a fu nction of azimuthal angle allow the determination of the dielectric te nsor including its orientation with respect to the sample surface. Thi s is done in ordered GaInP at the fixed energy of 3.3 eV where the ani sotropy manifests at largest. In such material this method allows to d iscriminate between the presence of singly or doubly ordered variants and, in the former case, allows to establish which one of the two subv ariants (<[(1)over bar 11]> or <[1(1)over bar 1]>) is grown. (C) 1997 Elsevier Science Ltd.