Dw. Lindle et al., AUGER-ELECTRON PHOTOION COINCIDENCE MEASUREMENTS OF ATOMS AND MOLECULES USING X-RAY SYNCHROTRON-RADIATION, Journal of electron spectroscopy and related phenomena, 67(2), 1994, pp. 373-385
As the availability of intense beams of hard X-rays from synchrotron-r
adiation sources has increased, interest in the fundamental interactio
ns of X-rays with deep core electrons in free atoms and molecules has
undergone a resurgence. These powerful X-ray sources have led to more
highly differential measurements, providing ever more detailed informa
tion about atomic and molecular structure and dynamics. One such impro
vement in measurement technique is the application of electron-ion coi
ncidence spectroscopy, which only recently has been extended to studie
s of deep core levels. A collaborative research program focusing on th
e dynamics of photoionization and Auger decay following hard X-ray abs
orption by atoms and small molecules, as well as subsequent fragmentat
ion in the molecular case, has been ongoing at the National Synchrotro
n Light Source for the past few years. This report summarizes the capa
bilities of the program by reviewing results on argon near the K edge,
and discusses briefly newer measurements on xenon and a few sulfur- a
nd chlorine-containing molecules.