We have determined the threshold dose for 8 MeV Bi+ ions to induce int
ermixing of GaAs quantum wells in AlGaAs and InGaAs quantum wells in G
aAs after rapid thermal annealing at 850-degrees-C. Our measured thres
hold for the GaAs/AlGaAs system agrees well with previous work. The th
reshold for the InGaAs/GaAs system is much lower and explains, at leas
t in part, earlier difficulties in the lateral patterning of nanostruc
tures by focused-ion-beam lithography.