SUPERCONDUCTING READOUT OF SEMICONDUCTOR MEMORY AT LIQUID-NITROGEN TEMPERATURE

Citation
C. Hilbert et al., SUPERCONDUCTING READOUT OF SEMICONDUCTOR MEMORY AT LIQUID-NITROGEN TEMPERATURE, Applied physics letters, 64(18), 1994, pp. 2442-2444
Citations number
14
Categorie Soggetti
Physics, Applied
Journal title
ISSN journal
00036951
Volume
64
Issue
18
Year of publication
1994
Pages
2442 - 2444
Database
ISI
SICI code
0003-6951(1994)64:18<2442:SROSMA>2.0.ZU;2-T
Abstract
The discovery of high-temperature superconducting materials raises the possibility of operating semiconducting and superconducting circuits at the same temperature in intimately hybridized devices and circuits. We report the experimental readout of standard CMOS memory cells usin g high-temperature superconducting flux flow devices at 77 K. Signific ant reduction in access times below that achievable with cryogenic CMO S alone was measured; a 4.5-ns access time was achieved on a 1-mum CMO S static random access memory. These results obtained using nonoptimiz ed, separate superconductor, and semiconductor chips demonstrate the p otential of hybrid superconductor-semiconductor memories for speed and power improvements over pure semiconductors operated at cryogenic tem peratures.