T. Wosinski et al., CATHODOLUMINESCENCE AND ELECTRON-BEAM-INDUCED CURRENT INVESTIGATIONS OF SINGLE DISLOCATIONS IN GAAS, Materials science & engineering. B, Solid-state materials for advanced technology, 24(1-3), 1994, pp. 112-114
Recombination activity of alpha and beta dislocations introduced by mi
cro-indentation in n-type GaAs has been studied by means of cathodolum
inescence (CL) and electron-beam-induced current (EBIC) techniques. Qu
antitative measurements of both CL and EBIC contrast profiles across s
everal tens of single 60-degrees dislocations revealed a distinct diff
erence between the contrast values of the two dislocation types. The r
esults are interpreted in terms of recombination activity associated w
ith the dislocation-related energy levels.