PHOTOTHERMAL SCANNING NEAR-FIELD MICROSCOPY

Two types of photothermal measurement technique will be presented, whi ch might allow the high spatially resolved investigation of thermal pr operties of substrates and thin films. Both methods employ measurement techniques which are based on scanning near-field microscopy. In the first case we show initial experimental results of periodic thermal ex pansion measurements of a laser excited sample surface using a scannin g tunneling microscope. In the second case we present the principle of a scanning thermal microscope, which measures the temperature distrib ution above the sample surface.