DETERMINATION OF THE INTERFACIAL STRUCTURE OF YBA2CU3O7 SRRUO3 THIN-FILM HETEROSTRUCTURES/

The interfaces in c-axis-oriented YBa2Cu3O7/SrRuO3/YBa2Cu3O7 triple-la yer films are investigated by means of high-resolution transmission el ectron microscopy. The atomic structure of the interface between the f irst YBa2Cu3O7 layer and the SrRuO3 layer is clarified by matching a s eries of experimental [010] images with corresponding calculated image s. For the (001) interface a (001) BaO plane of YBa2Cu3O7 layer faces a RuO2 plane of the SrRuO3 layer. Images along [100] of interface step s provide supporting evidence for this and allow. the atomic details a cross the steps to be determined, where a (010) Cu-O plane connects to an SrO plane. This allows the surface plane of the YBa2Cu3O7 films to be determined. It consists of (001) BaO and (100) and (010) Cu-O plan es.