FORMATION AND QUENCHING MECHANISMS OF THE ELECTRON-BEAM-PUMPED (XERB)+ IONIC EXCIMER IN DIFFERENT BUFFER GASES

Citation
Ftjl. Lankhorst et al., FORMATION AND QUENCHING MECHANISMS OF THE ELECTRON-BEAM-PUMPED (XERB)+ IONIC EXCIMER IN DIFFERENT BUFFER GASES, Applied physics letters, 64(19), 1994, pp. 2471-2473
Citations number
12
Categorie Soggetti
Physics, Applied
Journal title
ISSN journal
00036951
Volume
64
Issue
19
Year of publication
1994
Pages
2471 - 2473
Database
ISI
SICI code
0003-6951(1994)64:19<2471:FAQMOT>2.0.ZU;2-2
Abstract
The ionic excimer molecule XeRb+ is formed in an electron beam excited gas mixture of Xe, Rb, and a buffer gas. The formation and quenching mechanisms of ionic excimers are investigated by measuring the XeRb+ f luorescence as a function of the gas composition and gas pressure. The formation of XeRb+ is achieved by a three-body association reaction b etween Xe+, Rb, and a buffer gas atom. For the buffer gases He, Ne, or Ar the values of the important formation rate constants are determine d from the observed fluorescence signal decay.