MEASUREMENT OF THE SILICON (220) LATTICE SPACING

Authors
BASILE G BERGAMIN A CAVAGNERO G MANA G VITTONE E ZOSI G
Citation
G. Basile et al., MEASUREMENT OF THE SILICON (220) LATTICE SPACING, Physical review letters, 72(20), 1994, pp. 3133-3136
Citations number
27
Categorie Soggetti
Physics
Journal title
Physical review letters → ACNP
ISSN journal
00319007
Volume
72
Issue
20
Year of publication
1994
Pages
3133 - 3136
Database
ISI
SICI code
0031-9007(1994)72:20<3133:MOTS(L>2.0.ZU;2-S
Abstract
The (220) lattice spacing of a silicon crystal was measured by combine d x-ray and optical interferometry to about 3 x 10(-8) relative accura cy. The value obtained is d220 = 192015.551 +/- 0.005 fm. After correc ting for the impurity-induced lattice contraction, d220 = 192 015.569 +/- 0.006 fm is obtained.