Vortex lattice melting is investigated by transport measurements on Nb
Ge/Ge multilayers as a function of Ge thickness, which controls the an
isotropy of the system. Considerable changes are found between Ge thic
knesses of 2 and 4 nm. For low anisotropies the melting line for the m
ultilayers is indistinguishable from that for a single film with the s
ame total thickness. Increasing the anisotropy, a crossover is observe
d from 2D melting in the full sample at low fields to 2D melting in si
ngle layers at high fields, with melting of 3D nature in the intermedi
ate field range. Multilayers with high anisotropy only show the second
crossover.