Jm. Bassat et al., THE SEMICONDUCTOR-TO-METAL TRANSITION IN QUESTION IN LA2-XNIO4-GREATER-THAN-0 OR DELTA-LESS-THAN-0)(DELTA (DELTA), Journal of solid state chemistry, 110(1), 1994, pp. 124-135
Nonstoichiometric phases of the compound La2NiO4 have been synthesized
and chemically characterized. Their defect chemistry involves interst
itial oxygens, oxygen vacancies, and lanthanum vacancies. The nonstoic
hiometric phases follow the general formula La2-xNiO4+delta, with 0 le
ss-than-or-equal-to x less-than-or-equal-to 0.15 and delta greater-tha
n-or-equal-to 0 or delta < 0. The electrical properties of these compo
unds have been measured between 300 and 1200 K. They are characterized
below 600 K by a hopping conduction having a low and almost constant
hopping energy (congruent-to 80 meV). Above 600 K, the resistivity mea
sured under isobaric conditions shows an upturn which for a long time
has been interpreted as an indication of a semiconductor-to-metal tran
sition. Careful measurements of the sample weight in this temperature
range show, in fact, that the oxide does not maintain constant composi
tion. Taking this fact into account provides evidence suggesting that
the ''transition'' to a metallic state does not take place. Instead a
diffusive-type charge transport is involved in the high temperature ra
nge. (C) 1994 Academic Press, Inc.