R. Sundararaman et al., INFLUENCE OF SURFACE MICROSTRUCTURE ON THE ELECTRIC AND SPECTROSCOPICCHARACTERISTICS OF DIELECTRIC SURFACE FLASHOVER, IEEE transactions on dielectrics and electrical insulation, 1(2), 1994, pp. 315-322
Spectroscopic investigations were performed on high purity polycrystal
line alumina in vacuum to understand the effect of surface microstruct
ure as altered by mechanical surface treatment, on the optical as well
as the electrical characteristics of dielectric surface flashover. HV
pulses were applied to unpolished samples as well as to samples subje
cted to mechanical polishing by using SiC (268 to 16 mum) and diamond
abrasives (15 to 0.25 mum). The samples finished using diamond paste e
xhibited lower conditioned voltages and holdoff strength than those pr
epared with SiC abrasive finish. The spectrum of diamond-finished samp
les showed early development of molecular bands associated with the di
electric material. This behavior could be due to a larger density of d
efects developed on the surface during final polishing with diamond pa
ste. There seems to be a correlation between the electrical performanc
e of a sample, the polishing medium used for its surface finish, and t
he development of some of the spectral lines from flashover. The exper
imentally-observed phenomena in our studies point to different phases
of surface conditioning, in which the dominating factors for the origi
n of surface flashover seem to depend on the surface state of the insu
lator.