500-GHZ CHARACTERIZATION OF AN OPTOELECTRONIC S-PARAMETER TEST STRUCTURE

Authors
FRANKEL MY
Citation
My. Frankel, 500-GHZ CHARACTERIZATION OF AN OPTOELECTRONIC S-PARAMETER TEST STRUCTURE, IEEE microwave and guided wave letters, 4(4), 1994, pp. 118-120
Citations number
NO
Categorie Soggetti
Engineering, Eletrical & Electronic
Journal title
IEEE microwave and guided wave letters → ACNP
ISSN journal
10518207
Volume
4
Issue
4
Year of publication
1994
Pages
118 - 120
Database
ISI
SICI code
1051-8207(1994)4:4<118:5COAOS>2.0.ZU;2-6
Abstract
We propose a compact, high-bandwidth optoelectronic S-parameter test s tructure and characterize its performance via electrooptic sampling ov er a 500-GHz frequency range. The test structure is shown to be well-b ehaved over a 300-GHz bandwidth, with further improvement potential. A ctive devices can be wirebonded into the structure for characterizatio n, or they can be integrated on-wafer for improved performance.