TOTAL-REFLECTION X-RAY-FLUORESCENCE IN THE ULTRAMICRO ANALYSIS OF ARTISTS PIGMENTS

Authors
MOENS L DEVOS W KLOCKENKAMPER R VONBOHLEN A
Citation
L. Moens et al., TOTAL-REFLECTION X-RAY-FLUORESCENCE IN THE ULTRAMICRO ANALYSIS OF ARTISTS PIGMENTS, TrAC. Trends in analytical chemistry, 13(5), 1994, pp. 198-205
Citations number
24
Categorie Soggetti
Chemistry Analytical
Journal title
TrAC. Trends in analytical chemistry → ACNP
ISSN journal
01659936
Volume
13
Issue
5
Year of publication
1994
Pages
198 - 205
Database
ISI
SICI code
0165-9936(1994)13:5<198:TXITUA>2.0.ZU;2-8
Abstract
The analytical characterization of artists' pigments is very important for art history and for restoration and conservation. Total reflectio n X-ray fluorescence analysis makes possible the non-destructive analy sis of pigments. This new approach complements existing techniques and is unique in being at the same time accurate, fast, inexpensive, and well suited to the screening of pigments used in historical works of a rt.