L. Moens et al., TOTAL-REFLECTION X-RAY-FLUORESCENCE IN THE ULTRAMICRO ANALYSIS OF ARTISTS PIGMENTS, TrAC. Trends in analytical chemistry, 13(5), 1994, pp. 198-205
The analytical characterization of artists' pigments is very important
for art history and for restoration and conservation. Total reflectio
n X-ray fluorescence analysis makes possible the non-destructive analy
sis of pigments. This new approach complements existing techniques and
is unique in being at the same time accurate, fast, inexpensive, and
well suited to the screening of pigments used in historical works of a
rt.