MOIRE TECHNIQUE FOR LINEAR SHEAR MEASUREMENT IN PHOTOGRAPHIC SPECKLE SHEARING INTERFEROMETRY

Authors
NG TW CHAU FS
Citation
Tw. Ng et Fs. Chau, MOIRE TECHNIQUE FOR LINEAR SHEAR MEASUREMENT IN PHOTOGRAPHIC SPECKLE SHEARING INTERFEROMETRY, Optical engineering, 33(5), 1994, pp. 1726-1727
Citations number
9
Categorie Soggetti
Optics
Journal title
Optical engineering → ACNP
ISSN journal
00913286
Volume
33
Issue
5
Year of publication
1994
Pages
1726 - 1727
Database
ISI
SICI code
0091-3286(1994)33:5<1726:MTFLSM>2.0.ZU;2-Y