A. Plancon et Va. Drits, EXPERT-SYSTEM FOR STRUCTURAL CHARACTERIZATION OF PHYLLOSILICATES .1. DESCRIPTION OF THE EXPERT-SYSTEM, Clay Minerals, 29(1), 1994, pp. 33-38
An expert system has been designed for the structural characterization
of disordered phyllosilicates as well as the mixed-layer minerals and
the minerals containing stacking faults or isomorphic substitutions.
X-ray diffraction being the simplest tool for structural characterizat
ion, the expert system uses such data but can account for data provide
d by any characterization technique (infrared spectroscopy, EXAFS, etc
.). The expert system aims to summarize in a unique set the different
approaches of the structural characterization using diagrams or tables
which have been proposed, avoiding the requirement of the knowledge o
f their application field and excluding calculations. It runs in an in
teractive way, to mimic the way a human expert would draw its conclusi
ons.