EXPERT-SYSTEM FOR STRUCTURAL CHARACTERIZATION OF PHYLLOSILICATES .1. DESCRIPTION OF THE EXPERT-SYSTEM

Citation
A. Plancon et Va. Drits, EXPERT-SYSTEM FOR STRUCTURAL CHARACTERIZATION OF PHYLLOSILICATES .1. DESCRIPTION OF THE EXPERT-SYSTEM, Clay Minerals, 29(1), 1994, pp. 33-38
Citations number
37
Categorie Soggetti
Mineralogy
Journal title
ISSN journal
00098558
Volume
29
Issue
1
Year of publication
1994
Pages
33 - 38
Database
ISI
SICI code
0009-8558(1994)29:1<33:EFSCOP>2.0.ZU;2-Q
Abstract
An expert system has been designed for the structural characterization of disordered phyllosilicates as well as the mixed-layer minerals and the minerals containing stacking faults or isomorphic substitutions. X-ray diffraction being the simplest tool for structural characterizat ion, the expert system uses such data but can account for data provide d by any characterization technique (infrared spectroscopy, EXAFS, etc .). The expert system aims to summarize in a unique set the different approaches of the structural characterization using diagrams or tables which have been proposed, avoiding the requirement of the knowledge o f their application field and excluding calculations. It runs in an in teractive way, to mimic the way a human expert would draw its conclusi ons.