Va. Drits et A. Plancon, EXPERT-SYSTEM FOR STRUCTURAL CHARACTERIZATION OF PHYLLOSILICATES .2. APPLICATION TO MIXED-LAYER MINERALS, Clay Minerals, 29(1), 1994, pp. 39-45
The expert system described in the first part of this paper has been a
pplied to the identification of mixed-layer phyllosilicates (mica-smec
tite, mica-vermiculite, chlorite-smectite, chlorite-vermiculite, chlor
ite-swelling chlorite, chlorite-mica, chlorite-talc, kaolinite-smectit
e, talc-smectite), and to the determination of their structural parame
ters (Reichweite, R, and proportions of constituting layers, W(i)). Th
e expert system has been run utilizing the data extracted from (1) exp
erimental XRD patterns for which structural parameters had been evalua
ted by comparison with calculated patterns, or (2) patterns calculated
using pre-selected values of the structural parameters. In all cases
examined, the expert system provided correct conclusions concerning th
e identification of a mixed-layer phyllosilicate and the value of the
Reichweite, while the abundances of the component layers were evaluate
d with a margin of error usually <5%.