Aj. Antolak et Gs. Bench, PIXE TOMOGRAPHY OF SAMPLES WITH INHOMOGENEOUS ELEMENTAL COMPOSITION, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 88(3), 1994, pp. 297-307
Proton induced X-ray emission tomography (PIXET) can provide quantitat
ive, three-dimensional maps of elemental composition in small (less th
an a few mm) samples with fine (in principle micron scale) spatial res
olution. The concept of PIXET is similar to single photon emission tom
ography which produces cross-sectional concentration maps of photon em
itting radioactive elements within a sample. In PIXET, the photon emit
ting ''sources'' are elements along the trajectories (rays) of the inc
ident beam as it slows down in the sample. The number of X-rays detect
ed from a particular element at a given location in a sample depends o
n the local proton energy dependent X-ray production cross-section and
the attenuation of the X-rays from that location to the detector. X-r
ay mass attenuation coefficients and proton stopping powers are weight
ed by the local elemental fractions along the detected X-ray path or i
ncident beam direction. Local areal densities needed to complete the c
alculation of ion energy loss or X-ray attenuation are determined usin
g the complementary density map obtained from ion microtomography (IMT
) data. A software package is described which reconstructs cross-secti
onal images of density and element concentration of data obtained from
samples having inhomogeneous elemental composition. A code has also b
een developed which generates simulated IMT and PIXET sinograms from u
ser-specified density and composition maps of test objects. Simulated
data from test objects having inhomogeneous elemental composition have
been used to study the quality of images produced by the reconstructi
on code. Limitations of the PIXET technique are addressed. PIXET and I
MT reconstructions from measured experimental data are discussed.