F. Ditroi et al., INVESTIGATION OF SILICON WIDTH (P, P') RESONANCE SCATTERING IN (110) CHANNELING DIRECTION, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 89(1-4), 1994, pp. 164-167
Crystalline silicon samples were investigated both in channeling and r
andom directions by using the (p, p') resonance scattering at 2.3 MeV
bombarding energy. The samples were positioned in the scattering chamb
er of a VdG accelerator after 2 m collimating path. The peaks due to t
he resonance at 2.1 MeV were measured at different angles in the vicin
ity of the channeling and random directions. A peak shift and broadeni
ng was seen at the channeling and near channeling directions compared
with the random one. The spectra were also simulated using our modifie
d Monte Carlo calculation method for stopping, range and energy distri
bution in highly ordered materials. The energy shift and the broadenin
g between the random and the channeling spectra were compared and expl
ained.