DIFFUSION PARAMETERS AT THE PT-CO INTERFACE

Authors
RAISER D ROSSINI I SENS JC
Citation
D. Raiser et al., DIFFUSION PARAMETERS AT THE PT-CO INTERFACE, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 89(1-4), 1994, pp. 183-185
Citations number
13
Categorie Soggetti
Physics, Nuclear","Nuclear Sciences & Tecnology","Instument & Instrumentation
Journal title
Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms → ACNP
ISSN journal
0168583X
Volume
89
Issue
1-4
Year of publication
1994
Pages
183 - 185
Database
ISI
SICI code
0168-583X(1994)89:1-4<183:DPATPI>2.0.ZU;2-Z
Abstract
Rutherford backscattering analysis of the interface of Pt films deposi ted on polycrystalline Co substrates and annealed for various duration s and temperatures between 50-degrees and 700-degrees-C has given the values for the diffusion coefficients of Pt in Co and the composition of the alloys obtained. From the coefficients obtained at temperatures between 50-degrees and 200-degrees-C, where the interface is well-def ined, the activation energy Q and the frequency factor D0 have been de duced for the Pt-Co diffusion: Q = 0.102 +/- 0.015 eV/at and D0 = (0.5 1 +/- 0.24) X 10(-15) cm2/s. The composition of alloys obtained at hig her temperatures is discussed.