A HIGH-RESOLUTION CRYSTAL DIFFRACTION SPECTROMETER FOR X-RAY-ANALYSIS

Authors
LEHNERT U MERLA K ZSCHORNACK G
Citation
U. Lehnert et al., A HIGH-RESOLUTION CRYSTAL DIFFRACTION SPECTROMETER FOR X-RAY-ANALYSIS, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 89(1-4), 1994, pp. 238-241
Citations number
10
Categorie Soggetti
Physics, Nuclear","Nuclear Sciences & Tecnology","Instument & Instrumentation
Journal title
Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms → ACNP
ISSN journal
0168583X
Volume
89
Issue
1-4
Year of publication
1994
Pages
238 - 241
Database
ISI
SICI code
0168-583X(1994)89:1-4<238:AHCDSF>2.0.ZU;2-C
Abstract
A crystal diffraction spectrometer for high resolution X-ray spectrosc opy is described. Th experimental arrangement of the computer controll ed spectrometer allows the use of plane crystals as well as bent ones. Positioning of the analyzer crystal results with a precision better t han 3'' at a reproducibility of about 1''. The performance of the spec trometer is characterized by selected diffraction spectra and by first physical results, e.g. intensity ratios and asymmetry indices.