Bl. Lawrence et al., MEASUREMENT OF THE COMPLEX NONLINEAR REFRACTIVE-INDEX OF SINGLE-CRYSTAL P-TOLUENE SULFONATE AT 1064-NM, Applied physics letters, 64(21), 1994, pp. 2773-2775
Z-scan at 1064 nm was used with single, 35 ps pulses to measure the no
nlinear refraction and absorption in single crystal PTS (p-toluene sul
fonate). Detailed analysis of the Z-scan data based on DELTAn = n2I n3I2 and DELTAalpha = alpha2I + alpha3I2 yielded n2 = 5(+/-1) X 10(-12
) cm2/W, alpha2 = 100(+/-20) cm/GW, n3 = 5(+/-1)X 10(-21) cm4/W2 and a
lpha3 = - 5 (+/- 1) cm3/GW.2 The resulting two photon figure of merit
T for PTS is marginal for high throughput, all-optical waveguide switc
hing at 1064 nm.