MEASUREMENT OF THE COMPLEX NONLINEAR REFRACTIVE-INDEX OF SINGLE-CRYSTAL P-TOLUENE SULFONATE AT 1064-NM

Authors
LAWRENCE BL CHA M TORRUELLAS WE STEGEMAN GI ETEMAD S BAKER G KAJZAR F
Citation
Bl. Lawrence et al., MEASUREMENT OF THE COMPLEX NONLINEAR REFRACTIVE-INDEX OF SINGLE-CRYSTAL P-TOLUENE SULFONATE AT 1064-NM, Applied physics letters, 64(21), 1994, pp. 2773-2775
Citations number
17
Categorie Soggetti
Physics, Applied
Journal title
Applied physics letters → ACNP
ISSN journal
00036951
Volume
64
Issue
21
Year of publication
1994
Pages
2773 - 2775
Database
ISI
SICI code
0003-6951(1994)64:21<2773:MOTCNR>2.0.ZU;2-5
Abstract
Z-scan at 1064 nm was used with single, 35 ps pulses to measure the no nlinear refraction and absorption in single crystal PTS (p-toluene sul fonate). Detailed analysis of the Z-scan data based on DELTAn = n2I n3I2 and DELTAalpha = alpha2I + alpha3I2 yielded n2 = 5(+/-1) X 10(-12 ) cm2/W, alpha2 = 100(+/-20) cm/GW, n3 = 5(+/-1)X 10(-21) cm4/W2 and a lpha3 = - 5 (+/- 1) cm3/GW.2 The resulting two photon figure of merit T for PTS is marginal for high throughput, all-optical waveguide switc hing at 1064 nm.