ROOM-TEMPERATURE SHARP LINE ELECTROLUMINESCENCE AT LAMBDA=1.54-MU-M FROM AN ERBIUM-DOPED, SILICON LIGHT-EMITTING DIODE

Citation
B. Zheng et al., ROOM-TEMPERATURE SHARP LINE ELECTROLUMINESCENCE AT LAMBDA=1.54-MU-M FROM AN ERBIUM-DOPED, SILICON LIGHT-EMITTING DIODE, Applied physics letters, 64(21), 1994, pp. 2842-2844
Citations number
10
Categorie Soggetti
Physics, Applied
Journal title
ISSN journal
00036951
Volume
64
Issue
21
Year of publication
1994
Pages
2842 - 2844
Database
ISI
SICI code
0003-6951(1994)64:21<2842:RSLEAL>2.0.ZU;2-U
Abstract
We report the first room-temperature sharp line electroluminescence of an erbium-doped silicon light-emitting diode at lambda = 1.54 mum. Th e electroluminescence originates from an internal f-shell transition o f Er3+. The wavelength and linewidth are relatively independent of tem perature. The light intensity saturates at a drive current density of 5 A/cm2 due to the long excited state lifetime of Er3+. As the tempera ture increases from 100 K to room temperature, the light intensity dec reases significantly.