TRACE ROTATIONS OF PLANAR FEATURES WITH FOIL TILTING ON TRANSMISSION ELECTRON-MICROGRAPHS

Authors
HONG BD LESPERANCE G DICKSON JI MENG QC
Citation
Bd. Hong et al., TRACE ROTATIONS OF PLANAR FEATURES WITH FOIL TILTING ON TRANSMISSION ELECTRON-MICROGRAPHS, Materials characterization, 32(1), 1994, pp. 3-13
Citations number
9
Categorie Soggetti
Materials Science, Characterization & Testing
Journal title
Materials characterization → ACNP
ISSN journal
10445803
Volume
32
Issue
1
Year of publication
1994
Pages
3 - 13
Database
ISI
SICI code
1044-5803(1994)32:1<3:TROPFW>2.0.ZU;2-8
Abstract
Geometrical equations were derived from either a rotation cone model o r a double-tilt operation mode for predicting the variation of trace d irections of planar features with thin-foil tilting in transmission el ectron microscopy. The equations were shown to agree with transmission electron microscopy observations on platelike precipitates and on twi n interfaces in thin foils prepared from superalloy specimens. The ina pplicability of an equation previously proposed in the literature is d iscussed.