TIGHT-BINDING STUDIES OF CRYSTAL STABILITY AND DEFECTS IN BI2TE3

Citation
P. Pecheur et G. Toussaint, TIGHT-BINDING STUDIES OF CRYSTAL STABILITY AND DEFECTS IN BI2TE3, Journal of physics and chemistry of solids, 55(4), 1994, pp. 327-338
Citations number
31
Categorie Soggetti
Physics, Condensed Matter",Chemistry
ISSN journal
00223697
Volume
55
Issue
4
Year of publication
1994
Pages
327 - 338
Database
ISI
SICI code
0022-3697(1994)55:4<327:TSOCSA>2.0.ZU;2-L
Abstract
The stability of the crystal structure and the electronic state of iso lated point defects have been studied in Bi2Te3. The structure is rela ted to p-bonding, giving a basic cubic cell further stabilized by the formation of units of five layers of planes along the [111] axis of th e cubic cell. The impurities are treated via the Lifshits-Koster-Slate r method- Antistructure defects appear as single donors (Te(Bi)) or si ngle acceptors (Bi(Te)). Vacancies are strong perturbations: V(Te) are double donors and V(Bi) are triple acceptors. The impurities of colum n IV when substituted for Te give a resonance (or bound state) close t o the gap. Their electrical activity may then vary from double accepto r to inactive.