The low temperature behavior of the microwave surface resistance R(s)
and the penetration provides information on the pairing state. Fully o
xygenated films with low dc-resistivity in the normal state exhibit an
exponential temperature dependence corresponding to values of the ene
rgy gap up to 10 meV. For oxygen deficient films a linear R(s)(T) was
observed, similar to single crystals. This can be explained qualitativ
ely by induced superconductivity in the copper-oxygen chains.