ULTRAFAST HOT-ELECTRON DYNAMICS IN SILICON

Citation
Jr. Goldman et Ja. Prybyla, ULTRAFAST HOT-ELECTRON DYNAMICS IN SILICON, Semiconductor science and technology, 9(5), 1994, pp. 694-696
Citations number
17
Categorie Soggetti
Engineering, Eletrical & Electronic","Physics, Condensed Matter","Material Science
ISSN journal
02681242
Volume
9
Issue
5
Year of publication
1994
Supplement
S
Pages
694 - 696
Database
ISI
SICI code
0268-1242(1994)9:5<694:UHDIS>2.0.ZU;2-X
Abstract
Ultrafast (150 fs) time-resolved photoelectron spectroscopy is used to directly observe the energy relaxation of optically excited electrons in silicon. Conduction band electrons fit a thermal distribution by 1 20 fs pump-probe delay. The initial cooling rate of the excited distri bution is found to be extremely fast, followed by an electron-phonon t hermalization time of approximately 1 ps, and an overall much slower c ooling rate as the electrons lose energy. Here, we also report a new e ffect in two-photon photoemission unique to ultrashort laser pulses. O ur model and results demonstrate this effect to be a sensitive new mon itor of electron dynamics.