ELECTRONIC LIFETIMES IN EXCITED-STATE LANDAU-LEVELS

Citation
I. Maran et al., ELECTRONIC LIFETIMES IN EXCITED-STATE LANDAU-LEVELS, Semiconductor science and technology, 9(5), 1994, pp. 700-703
Citations number
13
Categorie Soggetti
Engineering, Eletrical & Electronic","Physics, Condensed Matter","Material Science
ISSN journal
02681242
Volume
9
Issue
5
Year of publication
1994
Supplement
S
Pages
700 - 703
Database
ISI
SICI code
0268-1242(1994)9:5<700:ELIEL>2.0.ZU;2-V
Abstract
We have determined for the first time the inter-Landau level lifetimes in GaAs/GaAlAs heterostructures in the spin polarized region (filling factor < 1). Intensity-dependent cyclotron resonance absorption has b een measured using a high-intensity optically pumped far-infrared (FIR ) laser. A detailed analysis of the lineshape of the cyclotron resonan ce absorption within a Drude model shows saturation at intensities of 0.1 W cm-2. The electronic lifetimes deduced using a three-level model depend inversely on the electron concentration in the excited Landau level, indicating electron-electron scattering to be the dominant rela xation mechanism.