K. Miyatsuji et al., HIGH-FIELD TRANSPORT OF HOT-ELECTRONS IN STRAINED SI SIGE HETEROSTRUCTURES/, Semiconductor science and technology, 9(5), 1994, pp. 772-774
Monte Carlo simulation is carried out to investigate the high-field tr
ansport properties of the two-dimensional electron gas in strained Si/
SiGe heterostructures. In the simulation we take into account the inte
rvalley scattering between twofold and fourfold valleys of an Si well
layer split by the tensile strain. Intervalley scatterings within the
twofold or fourfold valleys are also incorporated in the simulation as
well as the acoustic phonon scattering. We obtained an electron drift
velocity at room temperature as high as 1 X 10(7) cm s-1 at 10 kV cm-
1. Calculated results of 4.2 and 77 K show negative differential mobil
ity beyond 10 kV cm-1. At 77 K the transient response of the drift vel
ocity shows a remarkable overshoot, reaching about 3 x 10(7) cm s-1 at
0.2 ps at 10 kV cm-1.