ASTROPHYSICAL EXTENDED X-RAY-ABSORPTION FINE-STRUCTURE ANALYSIS

Citation
Jw. Woo et al., ASTROPHYSICAL EXTENDED X-RAY-ABSORPTION FINE-STRUCTURE ANALYSIS, The Astrophysical journal, 477(1), 1997, pp. 235-240
Citations number
15
Categorie Soggetti
Astronomy & Astrophysics
Journal title
ISSN journal
0004637X
Volume
477
Issue
1
Year of publication
1997
Part
1
Pages
235 - 240
Database
ISI
SICI code
0004-637X(1997)477:1<235:AEXFA>2.0.ZU;2-T
Abstract
We present an astrophysical extended X-ray absorption fine-structure ( EXAFS) analysis (AEA) tool. The AEA tool is designed to generate a num erical model of the modification to the X-ray absorption coefficient d ue to the EXAFS phenomenon. We have constructed a complete database (e lements up to the atomic number 92) of EXAFS parameters: central atom phase shift (2 delta(1)), backscattering phase shift (phi(b)), and bac kscattering amplitude (F). Using the EXAFS parameter data base, the AE A tool can generate a numerical model of any compound when the atomic numbers of neighboring atoms and their distances to the central X-ray- absorbing atom are given.