Tetrafluoromethane (CF4) was added to standard CH4/H-2 mixtures for di
amond growth in hot-filament-assisted chemical vapour deposition. CF4
concentrations in the range of 0.3%-3% were studied. Mass spectrometry
of the exhaust gas showed that only a small fraction (<15%) of CF4 wa
s thermally dissociated for filament temperatures over 1800 degrees C.
The observed stable products of its dissociation were mainly C2H2, CH
4 and HF. This CF4 addition considerably enhanced the nucleation and g
rowth characteristics on silicon and molybdenum. Diamond growth was ob
served with substrate temperature as low as 390 degrees C. A comparati
ve study for the growth dependence on substrate temperature with and w
ithout CF4 addition in the gas mixture is presented. The growth rate w
as measured by post-growth weighing with a micro balance. An activatio
n energy of 11 kcal mol(-1) for growth with CF4 addition was obtained.
Raman spectra and atomic force microscopy were used to characterize t
he diamond films.