R. Ramesham et al., CHARACTERIZATION OF HYPERVELOCITY IMPACT CRATERS ON CHEMICAL-VAPOR-DEPOSITED DIAMOND AND DIAMOND-LIKE CARBON-FILMS, Journal of Materials Science, 32(4), 1997, pp. 1029-1038
Microwave plasma chemical vapour-deposited (CVD) process has been used
to grow polycrystalline diamond films over silicon substrates. Diamon
d-like carbon (DLC) thin films were grown over silicon substrates usin
g a microwave plasma disc reactor. Reactant gases of CH4 and H-2 were
used in both CVD processes. Some preliminary feasibility tests were pe
rformed on the possible applicability of diamond and diamond-like carb
on thin films for space-protective applications against artificially s
imulated electrically actuated plasma drag hypervelocity impact of oli
vine particles. As-deposited films were analysed by Raman for their ch
emical nature. The morphology and dimensions of hypervelocity impact c
raters in diamond and DLC films was also studied by scanning electron
microscopy (SEM) and optical microscopy. The velocity of debris partic
les was determined by high-speed photography using a streak camera. Th
e size of the impact particles was determined by measuring the size of
the holes formed in the mylar sheet mounted just above the target dia
mond and DLC film;silicon and coordinates of the impact sites were det
ermined using the same apparatus.