The distribution of yttrium and lanthanum dopants has been mapped in y
ttrium- and lanthanum-doped polycrystalline aluminas using imaging sec
ondary-ion mass spectrometry (imaging-SIMS), Both dopants segregate to
grain boundaries and pore surfaces, On average, yttrium occupies 7.1%
-9.0% of the available grain-boundary cation sites, whereas lanthanum
occupies only 2.0%-5.2%, In 1000-ppm-yttrium-doped alumina, an abundan
ce of yttrium aluminum garnet precipitates also is observed. Implicati
ons of these observations to the creep behavior of alumina are discuss
ed, The similarity in the segregation behavior of yttrium and lanthanu
m highlights the potential of lanthanum-doped alumina for improved cre
ep properties.