THE EFFECT OF GOLD-NICKEL METALLIZATION MICROSTRUCTURE ON FLUXLESS SOLDERING

Citation
Rb. Cinque et Jw. Morris, THE EFFECT OF GOLD-NICKEL METALLIZATION MICROSTRUCTURE ON FLUXLESS SOLDERING, Journal of electronic materials, 23(6), 1994, pp. 533-539
Citations number
20
Categorie Soggetti
Engineering, Eletrical & Electronic","Material Science
ISSN journal
03615235
Volume
23
Issue
6
Year of publication
1994
Pages
533 - 539
Database
ISI
SICI code
0361-5235(1994)23:6<533:TEOGMM>2.0.ZU;2-0
Abstract
Gold plating is used in the microelectronics industry to maintain the wettability of metal substrates. The nature of wetting during solderin g of gold plated metals is discussed, and the results of experiments o n the fluxless wettability and oxidation of gold plated nickel are des cribed. The results suggest that electrodeposition of a thin gold plat e (0.14 mum) and the concurrent reduction of nickel oxide produce a go ld-nickel system which will wet without flux. Oxidation of nickel was observed to occur via nickel out-diffusion and by direct exposure of t he substrate through pinhole plating defects. Auger chemical analysis indicates that pinholes do not produce oxidation of the surrounding su bstrate area.