An attempt to create a first-order model of the operation mechanisms o
f SnO2-gate FETs sensitive to ammonia is reported in this work. In pre
vious work a strong dependence of the sensing effect on the relative h
umidity of the ambient has been reported. On these grounds, the presen
ce of adsorbed positive NH+ ions and negative OH- ions on the SnO2 sur
face is assumed and the model is built up on the lateral transportatio
n of these ions under the combined effect of the transversal gate-to-c
hannel electric field and the surface source-drain field. The transver
sal field is supposed to weaken electrostatically the adsorption bonds
of the OH- ions over the channel and of the NH+ ions over the saturat
ed surface area. This enables lateral transportation and redistributio
n of the ions along the surface source-drain field. Due to the strong
non-uniformity of the channel this redistribution results in equivalen
t addition to the gate voltage applied and, thus, in channel current m
odulation. Expressions for the floods of positive and negative ions ov
er the channel are derived. The calculated curves for the gate voltage
variation according to these expressions are in good agreement with e
xperimental data.