CHARACTERIZATION OF A-GE-H WITH THE STEADY-STATE PHOTOCARRIER GRATINGMEASUREMENT

Authors
Citation
E. Sauvain et Jh. Chen, CHARACTERIZATION OF A-GE-H WITH THE STEADY-STATE PHOTOCARRIER GRATINGMEASUREMENT, Journal of applied physics, 75(10), 1994, pp. 5191-5195
Citations number
16
Categorie Soggetti
Physics, Applied
Journal title
ISSN journal
00218979
Volume
75
Issue
10
Year of publication
1994
Part
1
Pages
5191 - 5195
Database
ISI
SICI code
0021-8979(1994)75:10<5191:COAWTS>2.0.ZU;2-G
Abstract
The steady state photocarrier grating measurement technique has been u sed and is shown to be valid for the characterization of steady-state transport properties of minority carriers in undoped improved quality hydrogenated amorphous germanium (a-Ge:H). Deviations from the theoret ically predicted behavior of the measurement have been observed on som e a-Ge:H samples. At room temperature in a-Ge:H, the ratio of photocon ductivity to dark conductivity is less than 1. The high density of the rmally generated carrier is observed to affect the measurement by redu cing its sensitivity. Whether it is also the cause of the observed dev iation will be discussed.