RAMAN DETERMINATION OF STRUCTURES OF LONG-PERIOD SIC POLYTYPES

Raman spectroscopy has been applied to identification of longer-period SiC polytypes. The stacking structures of 5 1 R and 1 3 2R polytypes have been examined, the result of which is consistent with electron- a nd x-ray-diffraction analyses. The possibility is discussed for Raman determination of the period and stacking structure of longer period po lytypes. It is demonstrated that Raman scattering is useful for the de termination of the structure of SiC polytypes.